Follow Bruker and explore the latest applications of AFM in the semiconductor industry with a panel of experts. What are the recommended cantilevers for measuring the mechanical properties of ...

Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...

A major advantage of atomic force microscopes (AFMs) is their versatility in integrating various operational modes that assess different material properties and functionalities. Among the most ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

AFM can provide new insights into 2D materials to better understand their potential applications. 2D materials, such as graphene and hexagonal boron nitride (hBN), have unusual features because they ...

Follow Bruker and explore the latest applications of AFM in the semiconductor industry with a panel of experts. We propose ...