In this paper, the design and implementation of a femtosecond-resolved ultrafast transmission electron microscope is presented, based on a thermionic gun geometry. Utilizing an additional magnetic ...

(Nanowerk News) In conventional electron microscopes, performing atomic-resolution observations of magnetic materials is particularly difficult because high magnetic fields are inevitably exerted on ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...

Cryo-Autoloader for automated and contamination-free loading of cassettes, containing up to 12 Autogrids Three-condenser lens system for automated, continuous parallel sample illumination tested at ...

(Nanowerk News) Electron microscopy enables researchers to visualize tiny objects such as viruses, the fine structures of semiconductor devices, and even atoms arranged on a material surface. Focusing ...

This article has been updated in January 2024. High resolution images of microscopic samples can be obtained experimentally using Scanning Electron Transmission Microscopy (STEM). It is an effective ...

Unlike the electron beam used in scanning and transmission electron microscopy (SEM, TEM), the beam in a focused ion beam system (FIB) is composed of gallium (Ga) ions. The ions forming the structure ...

Researchers have proposed a new method to form an electron lens that will help reduce installation costs for electron microscopes with atomic resolution, proliferating their use. Instead of the ...