Physicist Gregor Hlawacek, head of the EU project FIT4NANO, is responsible for a state-of-the-art facility at the HZDR where he can produce and analyze nanostructures using a particularly finely ...
SAN DIEGO, Sept. 30, 2025 (GLOBE NEWSWIRE) -- Beam Global (BEEM), (Nasdaq: BEEM), a leading provider of innovative and sustainable infrastructure solutions for the electrification of transportation ...
It has been over 30 years since the first focused ion beam was used to make a TEM specimen. FEI, a company that is now part of Thermo Fisher Scientific, has been an essential part of helping take ion ...
Logic semiconductor manufacturers plan to replace FinFET devices with Gate All Around at sub-3nm nodes. Applied Materials has introduced a complex seven chamber system with Atomic Layer Deposition as ...
Whether it is determining the origin of pollutants, characterizing contaminants in food, imaging individual biological cells or putting a date to historical objects, scientists use ion beams to help ...
insights from industryBrandon Van Leer & Eric GoergenSr. Product Marketing ManagersThermo Fisher Scientific In this interview, AZoM speaks with Brandon Van Leer, Sr. Product Marketing Manager, and ...
Helium ion beam (HIB) technology plays an important role in the extreme fields of nanofabrication. Due to high resolution and sensitivity, HIB nanofabrication technology is widely used to pattern ...
Utilizing Secondary Ion Mass Spectrometry (SIMS) for in-line metrology is a newly emerging method of process control that requires contamination-free measurements, enabling SIMS on product wafers.
When dealing with delicate structures, mixed-material composites, or complex multilayers, traditional methods like mechanical polishing can fall short, introducing artifacts, surface damage, or ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback