Fluorescence force microscopy is a combination of atomic force microscopy and fluorescence microscopy, which allows molecular dynamics to be studied. The technique can be applied to single molecules, ...

Force microscopy is a family of scanning probe microscopy techniques that enable the visualization and manipulation of materials at the nanoscale. These techniques rely on the interaction forces ...

A further development in atomic force microscopy now makes it possible to simultaneously image the height profile of nanometer-fine structures as well as the electric current and the frictional force ...

In this interview, AZoNano talks to Eduard Weichselbaumer, Senior Executive at PrimeNano, about the work they do in the Atomic Force Microscopy Field and the advances the company is making. Please ...

New model extracts stiffness and fluidity from AFM data in minutes, enabling fast, accurate mechanical characterization of living cells at single-cell resolution. (Nanowerk Spotlight) Cells are not ...

This handbook illustrates the wide variety of operating modes available on Bruker AFMs, going well beyond the standard high‑resolution topographic imaging capabilities of AFM. The modes are broken ...

A major advantage of atomic force microscopes (AFMs) is their versatility in integrating various operational modes that assess different material properties and functionalities. Among the most ...

Topgraphy and frequency shift images of the ITP radical in constant-current mode. Courtesy : D Ebeling Ten years ago, researchers succeeded in significantly increasing the lateral resolution of low ...

An atomic force microscope can be used as a single-electron current meter, according to new experiments by researchers at IBM. The technique, which measures the energy levels of single molecules on ...

With the inventions of transmission electron microscopy (TEM) in 1931 and scanning electron microscopy (SEM) shortly after in 1937, scientists gained an unprecedented ultrastructural view of the ...