EDN

Testing SerDes I/O links the third time around

From the title of this article, you probably assumed that it covers third-generation SerDes I/O interfaces such as PCI Express 3.0 or USB 3.0. While the principles described here certainly apply to ...
EDN

Collaboration focuses on low-cost, high-speed serdes I/O test

SAN FRANCISCO — LogicVision Inc. and DA-Test have announced a collaboration on low-cost, high-accuracy testing of high speed serializer/ deserializer (serdes) circuits. Using LogicVision's ETSerdes ...
Electronic Design

Enhanced I/O Test Suite Facilitates Test Connections

Demand for simple and fast test-system connections in multivendor instrument setups pushed Agilent to come up with E2094N I/O Libraries Suite 14.0, which enables error-free connections in under 15 ...
Semiconductor Engineering

HSIO Loopback Turns Challenges Into Opportunities For Test At 112 Gbps

For both PCIe and Ethernet (IEEE 802.3,) signals are getting mighty small. With PCIe 5 reaching 32 Gbps (NRZ at 32 GBaud) and 802.3 reaching 112 Gbps (PAM4 at 56 GBaud), typical eye-mask limits are ...
Electronic Design

Five Key Factors to Successful Serial I/O Testing

At some point, you’ll need to test that interface. Before testing, though, you should consider these five key factors. Practically everything you design these days includes some kind of serial ...