Both scan automated test pattern generation (ATPG) patterns and IJTAG patterns 1,2,3 are created for a piece of logic that is part of a much larger design. For both, the patterns are independent from ...

VLSI or Very Large Scale Integration has emerged as a crucial field in electronics engineering over the past few years. With the manufacture of complex integrated circuits (ICs) with millions of ...

Hierarchical test is a methodology that lets you perform most of the DFT work at the block level instead of at the flattened top level of the design. It is not a new approach. In fact, I’ve seen ...