Compact electron probes with large beam currents are required to achieve such precision. Routine production at the nanoscale requires immaculate and regulated surfaces to get the appropriate ...
The Easy Plasma SoftClean (EPSC) from Evactron ® integrates the Evactron ® 20EP remote Plasma De-Contaminator with the Evactron ® SoftClean chamber, thereby making a user friendly desktop plasma ...
Previously, the optimum use of SEM implied baking of one’s column and being careful to wear gloves while dealing with samples. However, with a reduction in feature sizes, this may not be sufficient.
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The Hummer 6.2 Sputtering System by Anatech is a vacuum coating instrument used for applying thin, uniform metal coatings to samples, often for scanning electron microscopy (SEM). It operates through ...
When preparing cross sections, the standard procedure using the FIB-SEM technique is the use of high currents to quickly remove material, then lower the FIB current for an improved beam profile and ...
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