About a dozen years ago, the world of test had reached an economic impasse: most digital designs had become sufficiently complex that standard scan testing techniques were no longer cost-effective.

Test compression offers the benefits of higher quality and lower test cost, but how do you choose the best methodology and tools for your current and future designs? Test compression evaluations ...

As IC design sizes continue to double every 18 to 24 months, those charged with testing the finished product are challenged on multiple fronts. Test-data volume and testing time are expanding, while ...

Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...