NORFOLK, Va. — Fault lines are fractures or breaks in the Earth's crust where tectonic plates move past each other, often resulting in earthquakes. These geological features are classified into three ...

This aerial image of the San Andreas Fault in the Carrizo Plain shows numerous curved drainages where fault slip has stretched stream channels to the left. Eventually, the channels get ‘reset’ when ...

Overview: We have developed an accurate fault modeling tool to capture variation-induced faults in Networks-on-Chip (NoCs). The core of our fault model has circuit-level accuracy, while its ...

ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.

Functional safety is a major challenge for field programmable gate arrays (FPGAs) and other semiconductor designs. Safety requirements go beyond traditional verification, which focuses on design bugs.

To compete in the fast-growing market for automotive ICs, semiconductor companies need to address new challenges across the entire design flow. To meet the ISO 26262 goal of zero defective parts per ...