SANTA CLARA, Calif., March 16, 2021 (GLOBE NEWSWIRE) -- Applied Materials, Inc. today unveiled a major innovation in process control that uses Big Data and AI technology to help semiconductor ...

BOISE, Idaho, Aug. 30, 2010 (GLOBE NEWSWIRE) -- Micron Technology, Inc. (Nasdaq:MU) announced today that it has started the deployment of the Applied Materials E3™ framework within its 300 millimeter ...

Product Briefing Outline: Applied Materials has introduced the ‘Applied E3’ advanced equipment and process control solution, intended to be a comprehensive factory automation (FA) software package for ...

This course addresses the basic theory behind Statistical Process Control (SPC), a method used in monitoring and controlling the quality of a process through statistical analysis to reduce variation.

New Enlight ® optical wafer inspection system combines breakthrough performance with new optics that capture more yield data from every wafer ExtractAI™ technology uses the power of AI to quickly ...