SANTA CLARA, Calif., March 16, 2021 (GLOBE NEWSWIRE) -- Applied Materials, Inc. today unveiled a major innovation in process control that uses Big Data and AI technology to help semiconductor ...
Product Briefing Outline: Applied Materials has introduced the ‘Applied E3’ advanced equipment and process control solution, intended to be a comprehensive factory automation (FA) software package for ...
New Enlight ® optical wafer inspection system combines breakthrough performance with new optics that capture more yield data from every wafer ExtractAI™ technology uses the power of AI to quickly ...
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